Scanning probe microscopy of soft matter: fundamentals and practices

Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy, showing how to usethe techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a wide range of soft materials. It concludes with a section on the latest techniques in nanomanipulation and patterning. Prof. Tsukruk is an internationally renowned leading expert in the field, and explains the topic in an easy-to-follow style. This first book to focus on theapplications is a must-have for both newcomers and established researchers using scanning probe microscopy in soft matter research. INDICE: Preface XV Part One Microscopy Fundamentals 1 1 Introduction 3 References 6 2 Scanning Probe Microscopy Basics 9 2.1 Basic Principles of Scanning Probe Microscopy 9 2.2 Scanning Tunneling Microscopy 10 2.3 Advent of AtomicForce Microscopy 10 2.4 Overview of Instrumentation 11 2.4.1 Scanners 11 2.4.2 Microcantilevers as Force Sensors 12 2.4.3 Electronic Feedback 15 2.5 Probesand Cantilevers in Scanning Probe Microscopy 16 2.5.1 Physical Attributes of Microcantilevers 18 2.5.2 Tip Characterization 21 2.5.3 Tip Modification 23 2.6 Modes of Operation 24 2.6.1 Contact Mode 25 2.6.2 Noncontact Mode and Tapping Mode 26 2.7 Advantages and Limitations 28 References 29 3 Basics of Atomic Force Microscopy Studies of Soft Matter 35 3.1 Physical Principles: Forces of Interaction 35 3.1.1 Long-Range Forces 36 3.1.2 Short-Range Forces 36 3.1.3 Other Forces of Interaction 38 3.1.4 Resolution Criteria 40 3.1.5 Scan Rates and Resonances 41 3.2 Imaging in Controlled Environment 42 3.2.1 AFM Imaging in Liquid 42 3.2.2 AFM at Controlled Temperature 44 3.2.3 Imaging in Controlled Humidity 44 3.3 Artifacts in AFM Imaging of Soft Materials 46 3.3.1 Surface Damage and Deformation 47 3.3.2 Tip Dilation 47 3.3.3 Damaged and Contaminated Tip or Surface 48 3.3.4 Noises and Vibrations 50 3.3.5 Tip Artifacts 51 3.3.6 Thermal Drift and Piezoelement Creep 53 3.3.7 Oscillations and Artificial Periodicities 55 3.3.8 Image Processing Artifacts 56 3.4 Some Suggestions and Hints for Avoiding Artifacts 59 3.4.1 Tip Testing and Deconvolution 59 3.4.2 Force Control 61 3.4.3 Tip Contamination and Cleaning 63 References 65 4 Advanced Imaging Modes 69 4.1 Surface Force Spectroscopy 69 4.1.1 Introduction to Force Spectroscopy 69 4.1.2 ForceDistance Curves 70 4.1.3 Force Mapping Mode 72 4.2 Friction Force Microscopy 72 4.3 Shear Modulation Force Microscopy 74 4.4 ChemicalForce Microscopy (CFM) 75 4.5 Pulsed Force Microscopy 77 4.6 Colloidal Probe Microscopy 78 4.7 Scanning Thermal Microscopy 79 4.7.1 Thermal Resistive Probes and Spatial Resolution 81 4.7.2 Localized Thermal Analysis 82 4.7.3 Thermal Conductivity 83 4.8 Kelvin Probe and Electrostatic Force Microscopy 86 4.9 Conductive Force Microscopy 88 4.10 Magnetic Force Microscopy 89 4.11 Scanning Acoustic Force Microscopy 90 4.11.1 Force Modulation 90 4.11.2 Ultrasonic Force Microscopy 90 4.12 High-Speed Scanning Probe Microscopy 92 References 94 Part Two Probing Nanoscale Physical and Chemical Properties 99 5 Mechanical Properties of Polymers and Macromolecules 101 5.1 Elements of Contact Mechanics and Elastic Modulus 102 5.1.1 General SFS Nanoprobing Principles 102 5.1.2 Substrate Effects 106 5.1.3 Issues and Key Assumptions with Nanomechanical Probing 1085.2 Probing of Elastic Moduli for Different Materials: Selected Examples 112 5.2.1 Bulk Materials and Blends 112 5.2.2 Ultrathin Polymer Films from Different Polymers 117 5.2.3 Probing Individual Macromolecules 122 5.3 Adhesion Measurements 125 5.4 Viscoelasticity Measurements

• ISBN: 978-3-527-32743-0
• Editorial: Wiley-VCH
• Encuadernacion: Cartoné
• Páginas: 661
• Fecha Publicación: 16/11/2011
• Nº Volúmenes: 1
• Idioma: Inglés