Swift Ion Beam Analysis in Nanosciences

Swift Ion Beam Analysis in Nanosciences

Jalabert, Denis
Vickridge, Ian

121,06 €(IVA inc.)

INDICE: Introduction Fundamentals of ion–solid interactions with a focus on the nanoscale Channelling and blocking 1D layers: Limits to depth resolution 2D and 3D objects: Aspects of lateral resolution Porous materials / nanomaterials Instruments Grazing incidence RBS RBS–channelling/blocking High resolution RBS (magnetic or electrostatic filters) MEIS Resonant NRA The place of nanoIBA in the characterisation forest Applications Example of resonances, light element profiling 3D example / quantum dots and nanowires / top down devices Channelling / defect profiling Blocking / strain profiling 3D MEIS / Real space structural analysis Conclusion

  • ISBN: 978-1-84821-577-1
  • Editorial: ISTE Ltd.
  • Encuadernacion: Cartoné
  • Páginas: 320
  • Fecha Publicación: 04/12/2014
  • Nº Volúmenes: 1
  • Idioma: Inglés