Advances in Imaging and Electron Physics, Volume 229 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Provides the authority and expertise of leading contributors from an international board of authorsPresents the latest release in the Advances in Imaging and Electron Physics series INDICE: The contributors in this volume include:1. Sameen Ahmed Khan2. Ramaswamy Jagannathan
- ISBN: 978-0-443-29648-2
- Editorial: Academic Press
- Encuadernacion: Cartoné
- Páginas: 888
- Fecha Publicación: 04/04/2024
- Nº Volúmenes: 1
- Idioma: